Showing 1 - 11 of 11 Results
1.
Diffusion Phenomena in Thin Films and Microelectronic Materials by Gupta, Devendra, Ho, Paul S. ISBN: 9780815511670 List Price: $139.00
2.
Low Dielectric Constant Materials for IC Applications by Ho, Paul S., Leu, Jihperng,... ISBN: 9783642632211 List Price: $199.00
3.
Advanced Interconnects for ULSI Technology by Baklanov, Mikhail, Ho, Paul... ISBN: 9780470662540 List Price: $205.00
4.
Advanced Interconnects for ULSI Technology by Baklanov, Mikhail, Ho, Paul... ISBN: 9781119963677 List Price: $205.00
5.
Electronic Packaging Materials Science V: Volume 203 by Lillie, Edwin D., Ho, Paul ... ISBN: 9781107409996 List Price: $35.00
6.
Materials Reliability Issues in Microelectronics: Volume 225 by Lloyd, James R., Yost, Fred... ISBN: 9781107409873 List Price: $35.00
7.
Stress-induced Phenomena in Metallization by Zschech, Ehrenfried, Maex, ... ISBN: 9780735403109 List Price: $148.00
8.
Stress-Induced Phenomena in Metallization by Ogawa, Shinichi, Ho, Paul S... ISBN: 9780735404595
9.
Stress-Induced Phenomena in Metallization Third International Workshop by Ho, Paul S., Bravman, John,... ISBN: 9781563964398 List Price: $140.00
10.
Stress-Induced Phenomena in Metallization Second International Workshop Austin, Tx March 1993 by Ho, Paul S., Li, Che-Yu, Tu... ISBN: 9781563962516 List Price: $120.00
11.
Stress-induced Phenomena In Metallization Seventh International Workshop On Stress-induced P... by Ho, Paul S., Baker, Sheffor... ISBN: 9780735402256 List Price: $136.00